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Title: Active voltage contrast imaging of cross-sectional surface of multilayer ceramic capacitor using helium ion microscopy

Abstract

We studied active voltage contrast (AVC) imaging using helium ion microscopy (HIM). We observed secondary electron (SE) images of the cross-sectional surface of multilayer ceramic capacitors (MLCCs) with and without a voltage applied to the internal electrodes. When no voltage was applied, we obtained an image reflecting the material contrast between the Ni internal electrode region and the BaTiO{sub 3} dielectric region of the cross-sectional surface of the MLCC. When a voltage was applied, the electrical potential difference between the grounded and the positively biased internal electrodes affected the contrast (voltage contrast). Moreover, attenuation of the SE intensity from the grounded to the positively biased internal electrodes was observed in the dielectric region. Kelvin probe force microscopy (KPFM) measurements of the contact potential difference (CPD) were performed on the same sample. By using the AVC image from the HIM observation and the CPD image from the KPFM measurement, we could quantitatively evaluate the electrical potential. We think that the results of this study will lead to an expansion in the number of applications of HIM.

Authors:
; ; ; ; ;  [1];  [2]
  1. National Institute for Materials Science, Tsukuba, Ibaraki 305-0047 (Japan)
  2. TAIYO YUDEN CO., LTD., Takasaki-shi, Gunma 370-3347 (Japan)
Publication Date:
OSTI Identifier:
22594319
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 109; Journal Issue: 5; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CAPACITORS; CERAMICS; DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; ELECTRODES; ELECTRONS; HELIUM; HELIUM IONS; IMAGES; ION MICROSCOPY; LAYERS; NICKEL; PROBES; SURFACES; TITANATES

Citation Formats

Sakai, C., E-mail: SAKAI.Chikako@nims.go.jp, Ishida, N., Masuda, H., Nagano, S., Kitahara, M., Fujita, D., and Ogata, Y. Active voltage contrast imaging of cross-sectional surface of multilayer ceramic capacitor using helium ion microscopy. United States: N. p., 2016. Web. doi:10.1063/1.4960524.
Sakai, C., E-mail: SAKAI.Chikako@nims.go.jp, Ishida, N., Masuda, H., Nagano, S., Kitahara, M., Fujita, D., & Ogata, Y. Active voltage contrast imaging of cross-sectional surface of multilayer ceramic capacitor using helium ion microscopy. United States. doi:10.1063/1.4960524.
Sakai, C., E-mail: SAKAI.Chikako@nims.go.jp, Ishida, N., Masuda, H., Nagano, S., Kitahara, M., Fujita, D., and Ogata, Y. 2016. "Active voltage contrast imaging of cross-sectional surface of multilayer ceramic capacitor using helium ion microscopy". United States. doi:10.1063/1.4960524.
@article{osti_22594319,
title = {Active voltage contrast imaging of cross-sectional surface of multilayer ceramic capacitor using helium ion microscopy},
author = {Sakai, C., E-mail: SAKAI.Chikako@nims.go.jp and Ishida, N. and Masuda, H. and Nagano, S. and Kitahara, M. and Fujita, D. and Ogata, Y.},
abstractNote = {We studied active voltage contrast (AVC) imaging using helium ion microscopy (HIM). We observed secondary electron (SE) images of the cross-sectional surface of multilayer ceramic capacitors (MLCCs) with and without a voltage applied to the internal electrodes. When no voltage was applied, we obtained an image reflecting the material contrast between the Ni internal electrode region and the BaTiO{sub 3} dielectric region of the cross-sectional surface of the MLCC. When a voltage was applied, the electrical potential difference between the grounded and the positively biased internal electrodes affected the contrast (voltage contrast). Moreover, attenuation of the SE intensity from the grounded to the positively biased internal electrodes was observed in the dielectric region. Kelvin probe force microscopy (KPFM) measurements of the contact potential difference (CPD) were performed on the same sample. By using the AVC image from the HIM observation and the CPD image from the KPFM measurement, we could quantitatively evaluate the electrical potential. We think that the results of this study will lead to an expansion in the number of applications of HIM.},
doi = {10.1063/1.4960524},
journal = {Applied Physics Letters},
number = 5,
volume = 109,
place = {United States},
year = 2016,
month = 8
}
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