Influence Al doped ZnO nanostructure on structural and optical properties

Journal Article · Tue Apr 19 04:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4945522· OSTI ID:22591160

Wahyuningsih, Sayekti; Chasanah, Uswatul; Munawaroh, Hanik ^[1]

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1. Electronic Material and Energy Research Group, Faculty of Mathematics and Natural Sciences, Sebelas Maret University, Jr. Sutami Street 36A Kentingan Surakarta 57126 (Indonesia)

The preparation of Al-doped ZnO (AZO) thin films prepared by the spin-coating method was reported. Preparation of AZO was conducted by annealing treatment at a temperature of 700°C. While the spin-coating process of AZO thin films were done at 2000 and 3000 rpm respectively. The structural properties of ZnO were determined by X- ray diffraction (XRD) analysis. ZnOnanostructure was formed after annealed at atemperature of 400°C.The morphology of ZnO was determined by Scanning Electron Microscopy (SEM) showed the irregular morphology about 30-50µm in size. Al doped on ZnO influenced the optical properties of those material. Increasing Al contain on ZnO cause of shifting to the lower wavelength. The optical properties of the ZnO as well as AZO films showed that higher reflectance on the ultraviolet region so those materials were used as anti-reflecting agent.Al addition significantly enhance the optical transparency and induce the blue-shift in optical bandgap of ZnO films.

• OSTI ID: 22591160
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1725; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ALUMINIUM
ALUMINIUM COMPOUNDS
ANNEALING
DOPED MATERIALS
ENERGY GAP
MORPHOLOGY
NANOSTRUCTURES
OPACITY
SCANNING ELECTRON MICROSCOPY
SPECTRAL REFLECTANCE
SPIN-ON COATING
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0400-1000 K
THIN FILMS
ULTRAVIOLET RADIATION
WAVELENGTHS
X-RAY DIFFRACTION
ZINC OXIDES