Synthesis, structural and optical characterization of undoped, N-doped ZnO and co-doped ZnO thin films

Journal Article · Fri May 15 04:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4915444· OSTI ID:22391758

Kumar, R.

ZnO, N-doped ZnO and Al-N co-doped ZnO thin films were deposited on ITO coated corning glass by spin coater using sol-gel method. The films were annealed in air at 450°C for one hour. The crystallographic structure and morphology of the films were studied by X-ray diffraction (XRD) and scanning electron microscopy (SEM) respectively. The X-ray diffraction results confirm that the thin films are of wurtzite hexagonal with a very small distortion. The optical properties were investigated by transmission spectra of different films using spectrophotometer (Shimadzu UV-VIS-NIR 3600). The results indicate that the N doped ZnO thin films have obviously enhanced transmittance in visible region. Moreover, the thickness of the films has strong influences on the optical constants.

• OSTI ID: 22391758
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1661; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION SPECTRA
ANNEALING
CRYSTAL STRUCTURE
DOPED MATERIALS
MORPHOLOGY
OPTICAL PROPERTIES
SCANNING ELECTRON MICROSCOPY
SOL-GEL PROCESS
SPECTROPHOTOMETRY
SYNTHESIS
THIN FILMS
X-RAY DIFFRACTION
ZINC OXIDES