Self-powered p-NiO/n-ZnO heterojunction ultraviolet photodetectors fabricated on plastic substrates
- Materials Science and Engineering Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
- Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
- Semiconductor and Dimensional Metrology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
- Department of Electrical and Computer Engineering, George Mason University, 4400 University Drive, Fairfax, Virginia 22030 (United States)
A self-powered ultraviolet (UV) photodetector (PD) based on p-NiO and n-ZnO was fabricated using low-temperature sputtering technique on indium doped tin oxide (ITO) coated plastic polyethylene terephthalate (PET) substrates. The p-n heterojunction showed very fast temporal photoresponse with excellent quantum efficiency of over 63% under UV illumination at an applied reverse bias of 1.2 V. The engineered ultrathin Ti/Au top metal contacts and UV transparent PET/ITO substrates allowed the PDs to be illuminated through either frontside or backside. Morphology, structural, chemical, and optical properties of sputtered NiO and ZnO films were also investigated.
- OSTI ID:
- 22499214
- Journal Information:
- APL Materials, Journal Name: APL Materials Journal Issue: 10 Vol. 3; ISSN 2166-532X; ISSN AMPADS
- Country of Publication:
- United States
- Language:
- English
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