Room temperature ferromagnetism in undoped and Ni doped In{sub 2}O{sub 3} thin films

Journal Article · Wed Jun 24 04:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4918160· OSTI ID:22490561

Krishna, N. Sai; Rao, N. Madhusudhana; Krishnamoorthi, C.; Begam, M. Rigana ^[1]; Amarendra, G. ^[2]

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1. Thin Films Laboratory, School of Advanced Sciences, VIT University, Vellore – 632014 (India)
2. Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam – 603102 (India)

Undoped and Ni (5 at.%) doped In{sub 2}O{sub 3} thin films were deposited on glass substrate using electron beam evaporation technique and Ni doped In{sub 2}O{sub 3} thin films were annealed at 450 oC. A systematic study was carried out on the structural, chemical and magnetic properties of the as deposited and annealed thin films. X-ray diffraction analysis revealed that all the films were cubic in structure and exhibied ferromagnetism at room temperature. The undoped In{sub 2}O{sub 3} thin films exhibited a saturation magnetization of 24.01 emu/cm3. Ni doped In{sub 2}O{sub 3} thin films annealed at 450 oC showed a saturation magnetization of 53.81 emu/cm3.

• OSTI ID: 22490561
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1665; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANNEALING
CUBIC LATTICES
DOPED MATERIALS
ELECTRON BEAMS
EVAPORATION
FERROMAGNETISM
GLASS
INDIUM OXIDES
MAGNETIC PROPERTIES
MAGNETIZATION
NICKEL
SATURATION
SUBSTRATES
TEMPERATURE RANGE 0273-0400 K
TEMPERATURE RANGE 0400-1000 K
THIN FILMS
X-RAY DIFFRACTION