Design of DC-contact RF MEMS switch with temperature stability
- Institute of RF- and OE- ICs, Southeast University, Nanjing, 210096 (China)
- Nanjing Electronic Devices Institute, Nanjing, 210016 (China)
In order to improve the temperature stability of DC-contact RF MEMS switch, a thermal buckle-beam structure is implemented. The stability of the switch pull-in voltage versus temperature is not only improved, but also the impact of stress and stress gradient on the drive voltage is suppressed. Test results show that the switch pull-in voltage is less sensitive to temperature between -20 °C and 100 °C. The variable rate of pull-in voltage to temperature is about -120 mV/°C. The RF performance of the switch is stable, and the isolation is almost independent of temperature. After being annealed at 280 °C for 12 hours, our switch samples, which are suitable for packaging, have less than 1.5% change in the rate of pull-in voltage.
- OSTI ID:
- 22488516
- Journal Information:
- AIP Advances, Journal Name: AIP Advances Journal Issue: 4 Vol. 5; ISSN AAIDBI; ISSN 2158-3226
- Country of Publication:
- United States
- Language:
- English
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