Interfacial thermal degradation in inverted organic solar cells
- University of Bordeaux, CNRS, Bordeaux INP, IMS, UMR 5218, F-33405 Talence (France)
The efficiency of organic photovoltaic (OPV) solar cells is constantly improving; however, the lifetime of the devices still requires significant improvement if the potential of OPV is to be realised. In this study, several series of inverted OPV were fabricated and thermally aged in the dark in an inert atmosphere. It was demonstrated that all of the devices undergo short circuit current-driven degradation, which is assigned to morphology changes in the active layer. In addition, a previously unreported, open circuit voltage-driven degradation mechanism was observed that is highly material specific and interfacial in origin. This mechanism was specifically observed in devices containing MoO{sub 3} and silver as hole transporting layers and electrode materials, respectively. Devices with this combination were among the worst performing devices with respect to thermal ageing. The physical origins of this mechanism were explored by Rutherford backscattering spectrometry and atomic force microscopy and an increase in roughness with thermal ageing was observed that may be partially responsible for the ageing mechanism.
- OSTI ID:
- 22486317
- Journal Information:
- Applied Physics Letters, Vol. 107, Issue 26; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
Similar Records
Characterizing and Improving the Thermal Stability of Organic Photovoltaics Based on Halogen-Rich Non-Fullerene Acceptors
Correlation of Qualification and Accelerated Testing with Field Degradation
Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ATOMIC FORCE MICROSCOPY
CURRENTS
EFFICIENCY
ELECTRIC POTENTIAL
ELECTRICAL FAULTS
ELECTRODES
INERT ATMOSPHERE
MOLYBDENUM OXIDES
ORGANIC SOLAR CELLS
PHOTOVOLTAIC EFFECT
ROUGHNESS
RUTHERFORD BACKSCATTERING SPECTROSCOPY
SILVER
THERMAL DEGRADATION