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Title: Effect of spacer layer thickness on structural and optical properties of multi-stack InAs/GaAsSb quantum dots

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4934695· OSTI ID:22485975
; ;  [1]; ;  [2]
  1. School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, Arizona 85287 (United States)
  2. Department of Physics, Arizona State University, Tempe, Arizona 85287 (United States)

The structural and optical properties of ten-stack InAs/GaAsSb quantum dots (QDs) with different spacer layer thicknesses (d{sub s} = 2, 5, 10, and 15 nm) are reported. X-ray diffraction analysis reveals that the strain relaxation of the GaAsSb spacers increases linearly from 0% to 67% with larger d{sub s} due to higher elastic stress between the spacer and GaAs matrix. In addition, the dislocation density in the spacers with d{sub s} = 10 nm is lowest as a result of reduced residual strain. The photoluminescence peak energy from the QDs does not change monotonically with increasing d{sub s} due to the competing effects of decreased compressive strain and weak electronic coupling of stacked QD layers. The QD structure with d{sub s} = 10 nm is demonstrated to have improved luminescence properties and higher carrier thermal stability.

OSTI ID:
22485975
Journal Information:
Applied Physics Letters, Vol. 107, Issue 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English