Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing
- CEMES, UPR-8011 CNRS, University of Toulouse, 29 rue Jeanne Marvig, 31055 Toulouse (France)
A dedicated transmission electron microscope sample holder has been used to study in situ the cold-field emission process of carbon cone nanotips (CCnTs). We show that when using a CCnT instead of a Au plate-anode, the standard deviation of the emission current noise can be decreased from the 10 nA range to the 1 nA range under vacuum conditions of 10{sup −5 }Pa. This shows the strong influence of the anode on the cold-field emission current noise.
- OSTI ID:
- 22483125
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 26 Vol. 106; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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