Spherical quartz crystals investigated with synchrotron radiation

Journal Article · Thu Oct 15 04:00:00 EDT 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4934197· OSTI ID:22482566

Pereira, N. R. ^[1]; Macrander, A. T. ^[2]; Hill, K. W. ^[3]; Baronova, E. O. ^[4]; George, K. M.; Kotick, J. ^[5]

---

1. Ecopulse, Inc., 7844 Vervain Ct., Springfield, Virginia 22152 (United States)
2. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
3. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08536 (United States)
4. Kurchatov Institute, Moscow (Russian Federation)
5. The Ohio State University, Columbus, Ohio 43210 (United States)

The quality of x-ray spectra and images obtained from plasmas with spherically bent crystals depends in part on the crystal’s x-ray diffraction across the entire crystal surface. We employ the energy selectivity and high intensity of synchrotron radiation to examine typical spherical crystals from alpha-quartz for their diffraction quality, in a perpendicular geometry that is particularly convenient to examine sagittal focusing. The crystal’s local diffraction is not ideal: the most noticeable problems come from isolated regions that so far have failed to correlate with visible imperfections. Excluding diffraction from such problem spots has little effect on the focus beyond a decrease in background.

• OSTI ID: 22482566
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 86; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CRYSTALS
DEFECTS
FOCUSING
GEOMETRY
IMAGES
PLASMA
QUARTZ
SPHERICAL CONFIGURATION
SURFACES
SYNCHROTRON RADIATION
X-RAY DIFFRACTION
X-RAY SPECTRA