Spherical quartz crystals investigated with synchrotron radiation

Pereira, N. R.; Macrander, A. T.; Hill, K. W.; Baronova, E. O.; George, K. M.; Kotick, J.

doi:10.1063/1.4934197

Spherical quartz crystals investigated with synchrotron radiation

Journal Article · Thu Oct 01 04:00:00 EDT 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4934197· OSTI ID:1391775

; Macrander, A. T.; Hill, K. W.; Baronova, E. O.; George, K. M.; Kotick, J.

To attain optimum performance in applications such as x-ray imaging and spectroscopy, a spherically bent crystal must diffract well across its entire surface. X-ray topography of sample crystals shows isolated regions where diffraction is problematic, even for a crystal where inspection with visible light does not suggest problems. Covering problem spots may improve the crystal’s focus and decrease the background. We explore the special properties of synchrotron radiation to examine typical spherical crystals from alpha-quartz, in a perpendicular geometry that is especially convenient to examine sagittal focusing.

Research Organization:: Argonne National Laboratory (ANL)

Sponsoring Organization:: USDOE Office of Science - Office of Basic Energy Sciences

DOE Contract Number:: AC02-06CH11357

OSTI ID:: 1391775

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 86; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

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