Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films
- Faculdade de Engenharia de Ilha Solteira, UNESP – Univ. Estadual Paulista, Departamento de Física e Química, 15385-000 Ilha Solteira, SP (Brazil)
- CNR, INO UOS A Gozzini, Area Ric Pisa S Cataldo, I-56124 Pisa (Italy)
Highlights: • Pyrochlore phase crystallizes near the bottom film-electrode interface. • PLZT films show a non-uniform microstrain and crystallite size in depth profile. • Complex grainy structure leads to different elastic modulus at the nanoscale. - Abstract: Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale.
- OSTI ID:
- 22420736
- Journal Information:
- Materials Research Bulletin, Vol. 61; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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