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Title: Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films

Abstract

Highlights: • Pyrochlore phase crystallizes near the bottom film-electrode interface. • PLZT films show a non-uniform microstrain and crystallite size in depth profile. • Complex grainy structure leads to different elastic modulus at the nanoscale. - Abstract: Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale.

Authors:
;  [1];  [2];  [2];  [2]; ;  [2]
  1. Faculdade de Engenharia de Ilha Solteira, UNESP – Univ. Estadual Paulista, Departamento de Física e Química, 15385-000 Ilha Solteira, SP (Brazil)
  2. CNR, INO UOS A Gozzini, Area Ric Pisa S Cataldo, I-56124 Pisa (Italy)
Publication Date:
OSTI Identifier:
22420736
Resource Type:
Journal Article
Journal Name:
Materials Research Bulletin
Additional Journal Information:
Journal Volume: 61; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0025-5408
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; COMPLEXES; ELASTICITY; ELECTRODES; INTERFACES; LANTHANUM; MICROSTRUCTURE; NANOSTRUCTURES; PEROVSKITE; PHASE TRANSFORMATIONS; PLZT; POLYCRYSTALS; PYROCHLORE; RANDOMNESS; SURFACES; SYNTHESIS; THIN FILMS; X-RAY DIFFRACTION

Citation Formats

Araújo, E.B., E-mail: eudes@dfq.feis.unesp.br, Nahime, B. O., Melo, M., Dinelli, F., Tantussi, F., Univ. Pisa, Dipartimento Fis Enrico Fermi, I-56127 Pisa, Baschieri, P., Fuso, F., Allegrini, M., and Univ. Pisa, Dipartimento Fis Enrico Fermi, I-56127 Pisa. Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films. United States: N. p., 2015. Web. doi:10.1016/J.MATERRESBULL.2014.09.055.
Araújo, E.B., E-mail: eudes@dfq.feis.unesp.br, Nahime, B. O., Melo, M., Dinelli, F., Tantussi, F., Univ. Pisa, Dipartimento Fis Enrico Fermi, I-56127 Pisa, Baschieri, P., Fuso, F., Allegrini, M., & Univ. Pisa, Dipartimento Fis Enrico Fermi, I-56127 Pisa. Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films. United States. https://doi.org/10.1016/J.MATERRESBULL.2014.09.055
Araújo, E.B., E-mail: eudes@dfq.feis.unesp.br, Nahime, B. O., Melo, M., Dinelli, F., Tantussi, F., Univ. Pisa, Dipartimento Fis Enrico Fermi, I-56127 Pisa, Baschieri, P., Fuso, F., Allegrini, M., and Univ. Pisa, Dipartimento Fis Enrico Fermi, I-56127 Pisa. Thu . "Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films". United States. https://doi.org/10.1016/J.MATERRESBULL.2014.09.055.
@article{osti_22420736,
title = {Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films},
author = {Araújo, E.B., E-mail: eudes@dfq.feis.unesp.br and Nahime, B. O. and Melo, M. and Dinelli, F. and Tantussi, F. and Univ. Pisa, Dipartimento Fis Enrico Fermi, I-56127 Pisa and Baschieri, P. and Fuso, F. and Allegrini, M. and Univ. Pisa, Dipartimento Fis Enrico Fermi, I-56127 Pisa},
abstractNote = {Highlights: • Pyrochlore phase crystallizes near the bottom film-electrode interface. • PLZT films show a non-uniform microstrain and crystallite size in depth profile. • Complex grainy structure leads to different elastic modulus at the nanoscale. - Abstract: Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale.},
doi = {10.1016/J.MATERRESBULL.2014.09.055},
url = {https://www.osti.gov/biblio/22420736}, journal = {Materials Research Bulletin},
issn = {0025-5408},
number = ,
volume = 61,
place = {United States},
year = {2015},
month = {1}
}