Effect of thickness on the stress and magnetoelectric coupling in bilayered Pb(Zr{sub 0.52}Ti{sub 0.48})O{sub 3}-CoFe{sub 2}O{sub 4} films

Journal Article · Wed Jan 28 00:00:00 EST 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4906407· OSTI ID:22412996

Wang, Jing ^[1]; Li, Zheng; Wang, Jianjun; Nan, Cewen ^[2]; He, Hongcai ^[3]

---

1. State Key Laboratory of Mechanics and Control of Mechanical Structures, College of Aerospace Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016 (China)
2. School of Materials Science and Engineering, State Key Lab of New Ceramics and Fine Processing, Tsinghua University, Beijing 100084 (China)
3. State Key Lab of Electronic Thin Films and Integrated Devices, School of Microelectronics and Solid-State Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054 (China)

Magnetoelectric bilayered Pb(Zr{sub 0.52}Ti{sub 0.48})O{sub 3}-CoFe{sub 2}O{sub 4}(PZT-CFO) films with different PZT thicknesses were grown on (111)Pt/Ti/SiO{sub 2}/Si substrates using chemical solution spin-coating. Structural characterization by X-ray diffraction and electron microscopy shows pure phases and well-defined interfaces between the PZT and CFO films. The CFO-PZT-substrate structure effectively alleviates the substrate clamping effect for the CFO layer, showing appreciable magnetoelectric responses in the composite films. Both the direct magnetoelectric effect and the magnetic field-induced Raman shifts in the A{sub 1}(TO{sub 1}) soft mode of PZT demonstrate the magnetic-mechanical-electric coupling in the films. The results also indicate that with a constant CFO layer thickness, the thickness of the PZT layer plays an important role in the stress relaxation and strong magnetoelectric coupling. The coupling could be further enhanced by increasing the CFO thickness, optimizing the volume (thickness) fraction of the PZT thickness, and releasing the clamping effect from the substrate.

• OSTI ID: 22412996
• Journal Information: Journal of Applied Physics, Vol. 117, Issue 4; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COBALT OXIDES
COUPLING
ELECTRICAL PROPERTIES
ELECTRON MICROSCOPY
FERRITES
FILMS
INTERFACES
LAYERS
MAGNETIC FIELDS
MAGNETIC PROPERTIES
PLATINUM
PZT
SILICON
SILICON OXIDES
SPIN-ON COATING
STRESS RELAXATION
SUBSTRATES
TITANIUM
X-RAY DIFFRACTION