Residual stress and magnetic behavior of multiferroic CoFe{sub 2}O{sub 4}/Pb(Zr{sub 0.52}Ti{sub 0.48})O{sub 3} thin films

Journal Article · Wed Apr 15 04:00:00 EDT 2009 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3115452· OSTI ID:21356119

Sim, Chow Hong; Pan, Z Z; Wang, John ^[1]

---

1. Department of Materials Science and Engineering, Faculty of Engineering, National University of Singapore, Singapore 117574 (Singapore)

Multiferroic composite thin films consisting of CoFe{sub 2}O{sub 4} (CFO) and Pb(Zr{sub 0.52}Ti{sub 0.48})O{sub 3} (PZT) layers were deposited through a combined route of rf magnetron sputtering and sol gel on Pt(111)/TiO{sub 2}/SiO{sub 2}/Si substrates. The coupling effects in the bilayered thin film were studied by looking at the relationships among the crystallite orientation, magnetic behavior, and the in-plane residual stress. Phase selective residual stress analysis conducted by using x-ray method demonstrated a close correlation between the stress imposed on the PZT layer and its texture. A change in the PZT layer orientation from (111) to (010) with the increasing layer thickness was observed in the multiferroic thin film as the system changes from an interface energy minimizing texture to a strain energy density minimizing texture. The CFO phase in the multiferroic thin films was preferably oriented in the (111) orientation. However, there is a change in magnetization as well as coercivity of the multiferroic thin films when the top PZT layer was varied in thickness. A close correlation between the magnetization and the in-plane stress in the CFO bottom layer imposed by the PZT film thickness was observed.

• OSTI ID: 21356119
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 8 Vol. 105; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CHALCOGENIDES
COBALT COMPOUNDS
COBALT OXIDES
COERCIVE FORCE
COHERENT SCATTERING
COMPOSITE MATERIALS
DEPOSITION
DIELECTRIC MATERIALS
DIFFRACTION
DIMENSIONS
ELECTRICAL PROPERTIES
ELECTROMAGNETIC RADIATION
ELEMENTS
ENERGY DENSITY
FERROELECTRIC MATERIALS
FERROMAGNETIC MATERIALS
FILMS
IONIZING RADIATIONS
LAYERS
LEAD COMPOUNDS
MAGNETIC MATERIALS
MAGNETIC PROPERTIES
MAGNETIZATION
MATERIALS
METALS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PLATINUM
PLATINUM METALS
PZT
RADIATIONS
RESIDUAL STRESSES
SCATTERING
SEMIMETALS
SILICON
SILICON COMPOUNDS
SILICON OXIDES
SOL-GEL PROCESS
SPUTTERING
STRESSES
TEXTURE
THICKNESS
THIN FILMS
TITANATES
TITANIUM COMPOUNDS
TITANIUM OXIDES
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS
X RADIATION
X-RAY DIFFRACTION
ZIRCONATES
ZIRCONIUM COMPOUNDS