skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Observation of weak carrier localization in green emitting InGaN/GaN multi-quantum well structure

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4917217· OSTI ID:22402846
; ;  [1];  [2]; ;  [3];  [4]
  1. Department of Physics, National Sun Yat-sen University, Kaohsiung 80424, Taiwan (China)
  2. Department of Mechanical and Electromechanical Engineering, National Sun Yat-sen University, Kaohsiung 80424, Taiwan (China)
  3. Department of Physics, Tamkang University, Tamsui Dist., New Taipei City 25137, Taiwan (China)
  4. Department of Physics, National Kaohsiung Normal University, Kaohsiung 80264, Taiwan (China)

Green emitting InGaN/GaN multi-quantum well samples were investigated using transmission electron microscopy, photoluminescence (PL), and time-resolved photoluminescence (TRPL) spectroscopy. Weak carrier localization with characteristic energy of ∼12 meV due to an inhomogeneous distribution of In in the InGaN quantum (QW) layer is observed. The temperature dependence of the PL peak energy exhibits S-shape phenomenon and is comparatively discussed within the framework of the Varshni's empirical formula. The full width at half maximum of the PL emission band shows an increasing-decreasing-increasing behavior with increasing temperature arising from the localized states caused by potential fluctuations. The radiative life time, τ{sub r}, extracted from the TRPL profile shows ∼T{sup 3/2} dependence on temperature above 200 K, which confirms the absence of the effect of carrier localization at room temperature.

OSTI ID:
22402846
Journal Information:
Journal of Applied Physics, Vol. 117, Issue 14; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English