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Low-loss, submicron chalcogenide integrated photonics with chlorine plasma etching

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4916207· OSTI ID:22395745
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  1. CREOL, The College of Optics and Photonics, University of Central Florida, Orlando, Florida 32816 (United States)

A chlorine plasma etching-based method for the fabrication of high-performance chalcogenide-based integrated photonics on silicon substrates is presented. By optimizing the etching conditions, chlorine plasma is employed to produce extremely low-roughness etched sidewalls on waveguides with minimal penalty to propagation loss. Using this fabrication method, microring resonators with record-high intrinsic Q-factors as high as 450 000 and a corresponding propagation loss as low as 0.42 dB/cm are demonstrated in submicron chalcogenide waveguides. Furthermore, the developed chlorine plasma etching process is utilized to demonstrate fiber-to-waveguide grating couplers in chalcogenide photonics with high power coupling efficiency of 37% for transverse-electric polarized modes.

OSTI ID:
22395745
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 11 Vol. 106; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English

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