A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization

Journal Article · Mon Dec 15 04:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4902934· OSTI ID:22392279

Page, Michael R.; Young, Justin R.; Bhallamudi, Vidya P.; Johnston-Halperin, Ezekiel; Pelekhov, Denis V.; Hammel, P. Chris ^[1]; Jacob, Jan ^[2]; Lewis, Jim; Wenzel, Lothar ^[3]

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1. Department of Physics, The Ohio State University, Columbus, Ohio 43210 (United States)
2. Werum Software and Systems CIS AG, Wulf-Werum-Straße 3, 21337 Lüneburg (Germany)
3. National Instruments, Austin, Texas 78759 (United States)

Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

• OSTI ID: 22392279
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 12 Vol. 85; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DETECTION
ELECTRONIC EQUIPMENT
FEEDBACK
FIELD EFFECT TRANSISTORS
GRAPHENE
MICROSCOPES
PERTURBATION THEORY
PROBES
SIGNALS