Surface Studies by Scanning Tunneling Microscopy
|
journal
|
July 1982 |
Atomic Force Microscope
|
journal
|
March 1986 |
Positioning single atoms with a scanning tunnelling microscope
|
journal
|
April 1990 |
Mechanical Control of Nanomaterials and Nanosystems
|
journal
|
September 2011 |
Nanomaterial Engineering and Property Studies in a Transmission Electron Microscope
|
journal
|
October 2011 |
Two-Dimensional Dielectric Nanosheets: Novel Nanoelectronics From Nanocrystal Building Blocks
|
journal
|
October 2011 |
Towards the Next Generation of Solid Oxide Fuel Cells Operating Below 600 °C with Chemically Stable Proton-Conducting Electrolytes
|
journal
|
September 2011 |
Nano-photocatalytic Materials: Possibilities and Challenges
|
journal
|
October 2011 |
A Polymer-Electrolyte-Based Atomic Switch
|
journal
|
November 2010 |
Atomic Switch: Atom/Ion Movement Controlled Devices for Beyond Von-Neumann Computers
|
journal
|
September 2011 |
Local modification of hydrogen-terminated silicon surfaces by clean and hydrogen-covered STM tips
|
journal
|
October 1997 |
Epitaxially grown WOx nanorod probes for sub-100nm multiple-scanning-probe measurement
|
journal
|
June 2006 |
Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor
|
journal
|
May 2001 |
Stability, resolution, and tip–tip imaging by a dual-probe scanning tunneling microscope
|
journal
|
December 2001 |
An ultrahigh vacuum dual-tip scanning tunneling microscope operating at 4.2 K
|
journal
|
December 2001 |
Design and performance of a beetle-type double-tip scanning tunneling microscope
|
journal
|
September 2006 |
Development of probe-to-probe approach method for an independently controlled dual-probe scanning tunneling microscope
|
journal
|
October 2007 |
Conductivity Measurement of Polydiacetylene Thin Films by Double-Tip Scanning Tunneling Microscopy
|
journal
|
October 2004 |
Construction of Independently Driven Double-Tip Scanning Tunneling Microscope
|
journal
|
December 2004 |
Nanotubes as nanoprobes in scanning probe microscopy
|
journal
|
November 1996 |
Carbon-nanotube tips for scanning probe microscopy: Preparation by a controlled process and observation of deoxyribonucleic acid
|
journal
|
June 1999 |
Growth of nanotubes for probe microscopy tips
|
journal
|
April 1999 |
Carbon nanotubes as tips in non-contact SFM
|
journal
|
April 2000 |
Stable atomic imaging of Si(111)-7×7 surface by scanning tunneling microscope with carbon nanotube tip
|
journal
|
July 2001 |
Metal-Coated Carbon Nanotube Tip for Scanning Tunneling Microscope
|
journal
|
April 2004 |
Four-Point Probe Resistance Measurements Using PtIr-Coated Carbon Nanotube Tips
|
journal
|
April 2007 |
Epitaxial growth of WO x nanorod array on W(001)
|
journal
|
January 2004 |
Structural and electrical properties of an electron-beam-irradiated C60 film
|
journal
|
January 2003 |
Independently driven four-tip probes for conductivity measurements in ultrahigh vacuum
|
journal
|
November 2001 |
Development of Four-Probe Microscopy for Electric Conductivity Measurement
|
journal
|
March 2005 |
Intrinsic current-voltage properties of nanowires with four-probe scanning tunneling microscopy: A conductance transition of ZnO nanowire
|
journal
|
July 2006 |
Four-probe electrical transport measurements on individual metallic nanowires
|
journal
|
January 2007 |
Atomic resolution with an atomic force microscope using piezoresistive detection
|
journal
|
February 1993 |
Variable-temperature independently driven four-tip scanning tunneling microscope
|
journal
|
May 2007 |
Development and performance of the nanoworkbench: A four tip STM for conductivity measurements down to submicrometer scales
|
journal
|
April 2005 |
Local potentiometry using a multiprobe scanning tunneling microscope
|
journal
|
August 2008 |
Novel optical approach to atomic force microscopy
|
journal
|
September 1988 |
Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method
|
journal
|
August 2007 |
Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams
|
journal
|
March 2011 |
Piezoelectric tip‐sample distance control for near field optical microscopes
|
journal
|
April 1995 |
Symmetrically arranged quartz tuning fork with soft cantilever for intermittent contact mode atomic force microscopy
|
journal
|
January 2003 |
Multi-Probe Atomic Force Microscopy Using Piezoelectric Cantilevers
|
journal
|
August 2007 |
Operation of Self-Sensitive Cantilever in Liquid for Multiprobe Manipulation
|
journal
|
August 2010 |
High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
|
journal
|
December 1998 |
Frequency modulation detection using high‐ Q cantilevers for enhanced force microscope sensitivity
|
journal
|
January 1991 |
Angled long tip to tuning fork probes for atomic force microscopy in various environments
|
journal
|
April 2011 |
Multiple-scanning-probe tunneling microscope with nanoscale positional recognition function
|
journal
|
July 2010 |
A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials
|
journal
|
June 2011 |
Electronic transport properties of epitaxial erbium silicide/silicon heterostructures
|
journal
|
July 1989 |
Growth and evolution of epitaxial erbium disilicide nanowires on Si?(001)
|
journal
|
September 2002 |
One-dimensional Schottky contact between ErSi2 nanowire and Si(001)
|
journal
|
June 2006 |
Electron conduction through quasi-one-dimensional indium wires on silicon
|
journal
|
June 2002 |
The conductivity of thin metallic films according to the electron theory of metals
|
journal
|
January 1938 |
The mean free path of electrons in metals
|
journal
|
January 1952 |
Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscope
|
journal
|
May 2008 |
Structure and electronic properties of self-assembled Pt silicide nanowires on Si(100)
|
journal
|
January 2007 |
Low-energy electron diffraction and scanning-tunneling-microscopy studies of the Pt/Si(001) surface
|
journal
|
May 1992 |
Barrier heights and silicide formation for Ni, Pd, and Pt on silicon
|
journal
|
September 1981 |
Helical microtubules of graphitic carbon
|
journal
|
November 1991 |
Individual single-wall carbon nanotubes as quantum wires
|
journal
|
April 1997 |
Establishing Ohmic contacts for in situ current–voltage characteristic measurements on a carbon nanotube inside the scanning electron microscope
|
journal
|
January 2006 |
Ballistic Transport in Metallic Nanotubes with Reliable Pd Ohmic Contacts
|
journal
|
November 2003 |
Four-Point Resistance of Individual Single-Wall Carbon Nanotubes
|
journal
|
October 2005 |
Order- electron transport calculations from ballistic to diffusive regimes by a time-dependent wave-packet diffusion method: Application to transport properties of carbon nanotubes
|
journal
|
August 2010 |
Time-Dependent Wave-Packet Diffusion Method for Quantum Transport Calculation: From Diffusive to Ballistic Regimes
|
journal
|
December 2008 |
High-Field Quasiballistic Transport in Short Carbon Nanotubes
|
journal
|
March 2004 |
Electron−Phonon Scattering in Metallic Single-Walled Carbon Nanotubes
|
journal
|
March 2004 |
Scaling of Resistance and Electron Mean Free Path of Single-Walled Carbon Nanotubes
|
journal
|
May 2007 |
Electronics using hybrid-molecular and mono-molecular devices
|
journal
|
November 2000 |
Nanoionics-based resistive switching memories
|
journal
|
November 2007 |
Electric Field Effect in Atomically Thin Carbon Films
|
journal
|
October 2004 |
Raman Spectrum of Graphene and Graphene Layers
|
journal
|
October 2006 |
Raman spectroscopy and imaging of graphene
|
journal
|
October 2008 |
Temperature dependent electron transport in graphene
|
journal
|
September 2007 |
Approaching ballistic transport in suspended graphene
|
journal
|
July 2008 |
Two-dimensional gas of massless Dirac fermions in graphene
|
journal
|
November 2005 |
Charged-impurity scattering in graphene
|
journal
|
April 2008 |
Visualization of anisotropic conductance in polydiacetylene crystal by dual-probe frequency-modulation atomic force microscopy/Kelvin-probe force microscopy
- Tsunemi, Eika; Kobayashi, Kei; Matsushige, Kazumi
-
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 28, Issue 3
https://doi.org/10.1116/1.3367983
|
journal
|
May 2010 |
Visualization of the Local Carrier Dynamics in an InGaN Quantum Well Using Dual-Probe Scanning Near-Field Optical Microscopy
|
journal
|
October 2010 |