Development and Application of Multiple-Probe Scanning Probe Microscopes
the research of advanced materials based on nanoscience and nanotechnology, it is often desirable to measure nanoscale local electrical conductivity at a designated position of a given sample. For this purpose, multiple-probe scanning probe microscopes (MP-SPMs), in which two, three or four scanning tunneling microscope (STM) or atomic force microscope (AFM) probes are operated independently, have been developed. Each probe in an MP-SPM is used not only for observing high-resolution STM or AFM images but also for forming an electrical contact enabling nanoscale local electrical conductivity measurement. The world's first double-probe STM (DP-STM) developed by the authors, which was subsequently modified to a triple-probe STM (TP-STM), has been used to measure the conductivities of one-dimensional metal nanowires and carbon nanotubes and also two-dimensional molecular films. A quadruple-probe STM (QP-STM) has also been developed and used to measure the conductivity of two-dimensional molecular films without the ambiguity of contact resistance between the probe and sample. Moreover, a quadruple-probe AFM (QP-AFM) with four conductive tuning-fork-type self-detection force sensing probes has been developed to measure the conductivity of a nanostructure on an insulating substrate. A general-purpose computer software to control four probes at the same time has also been developed and used in the operation of the QP-AFM. These developments and applications of MP-SPMs are reviewed in this paper.
- Research Organization:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy Solar Energy Technologies Program
- DOE Contract Number:
- AC36-08GO28308
- OSTI ID:
- 1047342
- Report Number(s):
- NREL/JA-5200-55126
- Journal Information:
- Advanced Materials, Journal Name: Advanced Materials Journal Issue: 13 Vol. 24
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
ATOMIC FORCE MICROSCOPY
CARBON
COMPUTERS
CONTROL
ELECTRIC CONDUCTIVITY
FILMS
IMAGES
MATERIALS
METALS
MICROSCOPES
NANOSTRUCTURES
NANOTUBES
OPERATION
SCANNING TUNNELING MICROSCOPY
TUNNELING
USES
carbon nanotubes
graphene
multiple-probe atomic force microscope
multiple-probe scanning tunneling microscope
nanoscale electrical conductivity
77 NANOSCIENCE AND NANOTECHNOLOGY
ATOMIC FORCE MICROSCOPY
CARBON
COMPUTERS
CONTROL
ELECTRIC CONDUCTIVITY
FILMS
IMAGES
MATERIALS
METALS
MICROSCOPES
NANOSTRUCTURES
NANOTUBES
OPERATION
SCANNING TUNNELING MICROSCOPY
TUNNELING
USES
carbon nanotubes
graphene
multiple-probe atomic force microscope
multiple-probe scanning tunneling microscope
nanoscale electrical conductivity