A novel von Hamos spectrometer for efficient X-ray emission spectroscopy in the laboratory

Journal Article · Thu May 15 00:00:00 EDT 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4875986· OSTI ID:22308854

Anklamm, Lars; Schlesiger, Christopher; Malzer, Wolfgang; Grötzsch, Daniel; Neitzel, Michael; Kanngießer, Birgit ^[1]

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1. Institute for Optic and Atomic Physics, Technical University Berlin, Hardenbergstr. 36, 10623 Berlin (Germany)

We present a novel, highly efficient von Hamos spectrometer for X-ray emission spectroscopy (XES) in the laboratory using highly annealed pyrolitic graphite crystals as the dispersive element. The spectrometer covers an energy range from 2.5 keV to 15 keV giving access to chemical speciation and information about the electronic configuration of 3d transition metals by means of the Kβ multiplet. XES spectra of Ti compounds are presented to demonstrate the speciation capabilities of the instrument. A spectral resolving power of E/ΔE = 2000 at 8 keV was achieved. Typical acquisition times range from 10 min for bulk material to hours for thin samples below 1 μm.

• OSTI ID: 22308854
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CRYSTALS
ELECTRONIC STRUCTURE
EMISSION SPECTROSCOPY
GRAPHITE
KEV RANGE
PYROLYTIC CARBON
SPECTROMETERS
TITANIUM COMPOUNDS
TRANSITION ELEMENTS
X-RAY EMISSION ANALYSIS