Characterizations of MCP performance in the hard x-ray range (6–25 keV)

Journal Article · Sat Nov 15 00:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4890293· OSTI ID:22308590

Wu, Ming; Rochau, Greg ^[1]; Moy, Ken ^[2]; Kruschwitz, Craig ^[3]

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1. Sandia National Laboratory, Albuquerque, New Mexico 87185 (United States)
2. Special Technology Laboratories, NSTec, Santa Barbara, California 93111-2335 (United States)
3. National Security Technologies, LLC, Los Alamos Operations, Los Alamos, New Mexico 87544 (United States)

MCP detector performance at hard x-ray energies from 6 to 25 keV was recently investigated using NSLS beamline X15A at BNL. Measurements were made with an NSTec Gen-II (H-CA-65) framing camera, based on a Photonis MCP with ∼10 μm in diameter pores, ∼12 μm center-center spacing, an L/D ratio of 46, and a bias angle of 8°. The MCP characterizations were focused on (1) energy and angle dependent sensitivity, (2) energy and angle dependent spatial resolution, (3) energy dependent gain performance, and (4) energy dependent dynamic range. These measurement corroborated simulation results using a Monte Carlo model that included hard x-ray interactions and the subsequent electron cascade in the MCP.

• OSTI ID: 22308590
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BNL
CAMERAS
COMPUTERIZED SIMULATION
ELECTRON DETECTION
ENERGY DEPENDENCE
HARD X RADIATION
KEV RANGE
MICROCHANNEL ELECTRON MULTIPLIERS
MONTE CARLO METHOD
NSLS
SENSITIVITY
SPATIAL RESOLUTION