Saturation and Dynamic Range of Microchannel Plate-Based X-Ray Imagers
This paper describes recent advances in Monte Carlo simulations of microchannel plate (MCP)–based x-ray detectors, a continuation of ongoing work in this area. A Monte Carlo simulation model has been developed over the past several years by National Security Technologies, LLC (NSTec). The model simulates the secondary electron emission process in an MCP pore and includes the effects of gain saturation. In this work we focus on MCP gain saturation and dynamic range. We have performed modeling and experimental characterizations of L/D = 46, 10-micron diameter, MCP-based detectors. The detectors are typically operated by applying a subnanosecond voltage pulse, which gates the detector on. Agreement between the simulations and experiment is very good for a variety of voltage pulse waveforms ranging in width from 150 to 300 ps. The results indicate that such an MCP begins to show nonlinear gain around 5 × 10^4 electrons per pore and hard saturation around 105 electrons per pore. The simulations show a difference in MCP sensitivity vs voltage for high flux of photons producing large numbers of photoelectrons on a subpicosecond timescale. Simulations and experiments both indicate an MCP dynamic range of 1 to 10,000, and the dynamic range depends on how the voltage is applied.
- Research Organization:
- Nevada Test Site/National Security Technologies, LLC (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC52-06NA25946
- OSTI ID:
- 1056317
- Report Number(s):
- DOE/NV/25946--1503
- Country of Publication:
- United States
- Language:
- English
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