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Comparison of electrostatic and localized plasmon induced light enhancement in hybrid InGaN/GaN quantum wells

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4884075· OSTI ID:22299893
; ; ;  [1];  [2];  [3]
  1. Department of Physics, University of North Texas, Denton, Texas 76203 (United States)
  2. CICECO, University of Aveiro, 3810-193 Aveiro (Portugal)
  3. SUPA, Institute of Photonics, University of Strathclyde, Glasgow (United Kingdom)
The light enhancement phenomena in InGaN/GaN multi-quantum wells (MQWs) infiltrated with metal nanoparticles (NPs) are studied using resonant and off-resonant localized plasmon interactions. The emission and recombination characteristics of carriers in InGaN/GaN MQW structures with inverted hexagonal pits (IHPs) are modified distinctly depending on the nature of their interaction with the metal NPs and with the pumping and emitted photons. It is observed that the emission intensity of light is significantly enhanced when the emission energy is off-resonant to the localized plasmon frequency of the metal nanoparticles. This results in enhanced emission from MQW due to Au nanoparticles and from IHPs due to Ag nanoparticles. At resonant-plasmon frequency of the Ag NPs, the emission from MQWs is quenched due to the re-absorption of the emitted photons, or due to the drift carriers from c-plane MQWs towards the NPs because of the Coulomb forces induced by the image charge effect.
OSTI ID:
22299893
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 24 Vol. 104; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English