Measuring inside damage of individual multi-walled carbon nanotubes using scanning transmission X-ray microscopy

Journal Article · Mon Jun 16 04:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4883919· OSTI ID:22299880

Liu, Jinyin; Bai, Lili; Zhao, Guanqi; Sun, Xuhui; Zhong, Jun ^[1]; Wang, Jian ^[2]

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1. Soochow University-Western University Centre for Synchrotron Radiation Research, Institute of Functional Nano and Soft Materials (FUNSOM) and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123 (China)
2. Canadian Light Source, Inc., University of Saskatchewan, Saskatoon, Saskatchewan S7N 0X4 (Canada)

The electronic structure of individual multi-walled carbon nanotubes (MWCNTs) has been probed using scanning transmission X-ray microscopy (STXM). Although transmission electron microscope (TEM) images show that the exterior of the MWCNTs are clean and straight; the inside structure of some of the MWCNTs is much less well ordered, as revealed by STXM. The amorphization of the interior tubes can be introduced in the growth or modification processes. Moreover, TEM measurement with high dose may also lead to the inside damage. Our results reveal that the structure of individual MWCNTs can be complex and suggest that electronic structure measurements are an important tool for characterizing carbon nanomaterials.

• OSTI ID: 22299880
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 24 Vol. 104; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
AMORPHOUS STATE
CARBON NANOTUBES
CRYSTAL GROWTH
DAMAGE
ELECTRONIC STRUCTURE
MODIFICATIONS
TRANSMISSION
TRANSMISSION ELECTRON MICROSCOPY
X RADIATION