Morphological change of multiwalled carbon nanotubes through high-energy (MeV) ion irradiation

Journal Article · Sat Jan 15 04:00:00 EST 2005 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.1834721· OSTI ID:20665011

Kim, H M; Kim, H S; Park, S K; Joo, J; Lee, T J; Lee, C J ^[1]

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1. Department of Physics, Korea University, Seoul 136-713 (Korea, Republic of)

Multiwalled carbon nanotubes (MWCNTs) were expanded by 2.5 times in diameter through high-energy (MeV) ion irradiation. Pristine MWCNTs were synthesized onto SiO{sub 2} substrate by chemical vapor deposition. The 4 MeV Cl{sup 2+} ions with a dose of 3x10{sup 16} ions/cm{sup 2} were irradiated on MWCNTs. From high-resolution transmission electron microscopy (HR-TEM) images, the average diameter of the high-energy-ion-irradiated MWCNTs was {approx}180 nm, while that of the pristine MWCNTs was {approx}70 nm. The wall thickness of the pristine and the high-energy-ion-irradiated MWCNT samples was {approx}20 nm and 40-50 nm, respectively. We observed the clear formation of nanocompartments with bamboolike structure inside the tubes after ion irradiation. The amorphous carbon structure in the ion-irradiated MWCNT shells was observed from Raman spectra. Based on the results of HR-TEM and Raman spectra, the expansion of the systems represents morphological transition from crystalline graphite structure to amorphous carbon or finite sized graphite structure due to the ion impact. We suggest that high-energy ion irradiation can be useful for the modification of MWCNT structures.

• OSTI ID: 20665011
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 2 Vol. 97; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AMORPHOUS STATE
CARBON
CHEMICAL VAPOR DEPOSITION
CHLORINE IONS
EXPANSION
GRAPHITE
ION BEAMS
IRRADIATION
MEV RANGE 01-10
MORPHOLOGICAL CHANGES
NANOTUBES
RAMAN SPECTRA
RESOLUTION
SILICON OXIDES
SUBSTRATES
THICKNESS
TRANSMISSION ELECTRON MICROSCOPY