Adhesion and degradation of organic and hybrid organic-inorganic light-emitting devices

Journal Article · Fri Feb 28 04:00:00 EST 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4867051· OSTI ID:22277987

Momodu, D. Y.; Chioh, A. V. ^[1]; Tong, T. ^[2]; Zebaze Kana, M. G. ^[3]; Soboyejo, W. O. ^[1]

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1. Department of Materials Science and Engineering, African University of Science and Technology, Federal Capital Territory, Abuja (Nigeria)
2. Department of Electrical and Computer Engineering, Princeton University, Princeton, New Jersey 08544 (United States)
3. Physics Advanced Laboratory, Sheda Science and Technology Complex, Abuja (Nigeria)

This paper presents the results of a combined analytical, computational, and experimental study of adhesion and degradation of Organic Light Emitting Devices (OLEDs). The adhesion between layers that are relevant to OLEDs is studied using an atomic force microscopy technique. The interfacial failure mechanisms associated with blister formation in OLEDs and those due to the addition of TiO{sub 2} nanoparticles into the active regions are then elucidated using a combination of fracture mechanics, finite element modeling and experiments. The blisters observed in the models are shown to be consistent with the results from adhesion, interfacial fracture mechanics models, and prior reports of diffusion-assisted phenomena. The implications of the work are then discussed for the design of OLED structures with improved lifetimes and robustness.

• OSTI ID: 22277987
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 8 Vol. 115; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
ADHESION
ATOMIC FORCE MICROSCOPY
BLISTERS
DIFFUSION
FRACTURE MECHANICS
INTERFACES
LAYERS
LIFETIME
LIGHT EMITTING DIODES
NANOSTRUCTURES
PARTICLES
TITANIUM OXIDES