Real-time interface investigation on degradation mechanism of organic light-emitting diode by in-operando X-ray spectroscopies
Journal Article
·
· Organic Electronics
- Soochow Univ., Suzhou (China); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Soochow Univ., Suzhou (China); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Chinese Academy of Sciences, Shanghai (China)
- Soochow Univ., Suzhou (China)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Santa Cruz, CA (United States)
Understanding the chemical evolution at the interface of organic light-emitting diodes (OLEDs) under working conditions is critical for addressing device failure and further improving performance. In this work, an in-operando approach was developed employing synchrotron-based X-ray absorption spectroscopy (XAS) to investigate the electronic structures and chemical degradation mechanisms of a model tris(8-hydroxyquinoline) aluminum (Alq3)-based OLED device under working condition. The results identify that Mg atoms from the electrode migrate into the Alq3 organic layer under a potential bias and replace Al atom sites, forming the unstable Mgq3 species which lead to device degradation. Here, the findings from the classic and simple model device elucidate the degradation mechanisms occurred at the interface of OLED devices, which may facilitate the development of more efficient and stable OLED devices with complex structures.
- Research Organization:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- AC02-05CH11231
- OSTI ID:
- 1838425
- Journal Information:
- Organic Electronics, Journal Name: Organic Electronics Vol. 87; ISSN 1566-1199
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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