Ferromagnetic resonance of sputtered yttrium iron garnet nanometer films

Journal Article · Wed May 07 04:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4852135· OSTI ID:22273943

Liu, Tao ^[1]; Chang, Houchen; Sun, Yiyan; Kabatek, Michael; Wu, Mingzhong ^[1]; Vlaminck, Vincent; Hoffmann, Axel ^[2]; Deng, Longjiang ^[3]

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1. Department of Physics, Colorado State University, Fort Collins, Colorado 80523 (United States)
2. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
3. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China)

Growth of nm-thick yttrium iron garnet (YIG) films by sputtering and ferromagnetic resonance (FMR) properties in the films were studied. The FMR linewidth of the YIG film decreased as the film thickness was increased from several nanometers to about 100 nm. For films with very smooth surfaces, the linewidth increased linearly with frequency. In contrast, for films with big grains on the surface, the linewidth-frequency response was strongly nonlinear. Films in the 7–26 nm thickness range showed a surface roughness between 0.1 nm and 0.4 nm, a 9.48-GHz FMR linewidth in the 6–10 Oe range, and a damping constant of about 0.001.

• OSTI ID: 22273943
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 17 Vol. 115; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
DAMPING
FERRITE GARNETS
FERROMAGNETIC RESONANCE
GHZ RANGE
IRON OXIDES
NONLINEAR PROBLEMS
ROUGHNESS
SPUTTERING
SURFACES
THICKNESS
THIN FILMS
YTTRIUM COMPOUNDS