Ferromagnetic resonance of sputtered yttrium iron garnet nanometer films

Journal Article · Wed May 07 04:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4852135· OSTI ID:1356642

Liu, Tao; Chang, Houchen; Vlaminck, Vincent; Sun, Yiyan; Kabatek, Michael; Hoffmann, Axel; Deng, Longjiang; Wu, Mingzhong

Growth of nm-thick yttrium iron garnet (YIG) films by sputtering and ferromagnetic resonance (FMR) properties in the films were studied. The FMR linewidth of the YIG film decreased as the film thickness was increased from several nanometers to about 100 nm. For films with very smooth surfaces, the linewidth increased linearly with frequency. In contrast, for films with big grains on the surface, the linewidth-frequency response was strongly nonlinear. Films in the 7–26 nm thickness range showed a surface roughness between 0.1 nm and 0.4nm, a 9.48-GHz FMR linewidth in the 6–10Oe range, and a damping constant of about 0.001.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: U.S. Army Research Laboratory - U.S. Army Research Office (ARO); National Science Foundation (NSF); USDOE Office of Science - Office of Basic Energy Sciences - Materials Sciences and Engineering Division; National Institute of Standards and Technology (NIST)
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 1356642
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 17 Vol. 115; ISSN 0021-8979
• Publisher: American Institute of Physics (AIP)
• Country of Publication: United States
• Language: English