Deep traps in n-type GaN epilayers grown by plasma assisted molecular beam epitaxy
Journal Article
·
· Journal of Applied Physics
- Institute of Physics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw (Poland)
- Institute of Physics, Polish Academy of Sciences, Al. Lotnikow 32/46, 02-668 Warsaw (Poland)
In this study, we present the results of investigations on Schottky Au-GaN diodes by means of conventional DLTS and Laplace DLTS methods within the temperature range of 77 K–350 K. Undoped GaN layers were grown using the plasma-assisted molecular beam epitaxy technique on commercial GaN/sapphire templates. The quality of the epilayers was studied by micro-Raman spectroscopy (μ-RS) which proved the hexagonal phase and good crystallinity of GaN epilayers as well as a slight strain. The photoluminescence spectrum confirmed a high crystal quality by intense excitonic emission but it also exhibited a blue emission band of low intensity. DLTS signal spectra revealed the presence of four majority traps: two high-temperature and two low-temperature peaks. Using the Laplace DLTS method and Arrhenius plots, the apparent activation energy and capture cross sections were obtained. For two high-temperature majority traps, they were equal to E{sub 1} = 0.65 eV, σ{sub 1} = 8.2 × 10{sup −16} cm{sup 2} and E{sub 2} = 0.58 eV, σ{sub 2} = 2.6 × 10{sup −15} cm{sup 2} whereas for the two low-temperature majority traps they were equal to E{sub 3} = 0.18 eV, σ{sub 3} = 9.7 × 10{sup −18} cm{sup 2} and E{sub 4} = 0.13 eV, σ{sub 4} = 9.2 × 10{sup −18} cm{sup 2}. The possible origin of the traps is discussed and the results are compared with data reported elsewhere.
- OSTI ID:
- 22271260
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 2 Vol. 115; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ACTIVATION ENERGY
COMPARATIVE EVALUATIONS
CRYSTALS
DEEP LEVEL TRANSIENT SPECTROSCOPY
EMISSION SPECTRA
GALLIUM NITRIDES
LAYERS
MOLECULAR BEAM EPITAXY
N-TYPE CONDUCTORS
PHOTOLUMINESCENCE
PLASMA
RAMAN SPECTROSCOPY
SAPPHIRE
STRAINS
TEMPERATURE DEPENDENCE
TRAPS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ACTIVATION ENERGY
COMPARATIVE EVALUATIONS
CRYSTALS
DEEP LEVEL TRANSIENT SPECTROSCOPY
EMISSION SPECTRA
GALLIUM NITRIDES
LAYERS
MOLECULAR BEAM EPITAXY
N-TYPE CONDUCTORS
PHOTOLUMINESCENCE
PLASMA
RAMAN SPECTROSCOPY
SAPPHIRE
STRAINS
TEMPERATURE DEPENDENCE
TRAPS