Conduction band offset determination between strained CdSe and ZnSe layers using DLTS

Journal Article · Wed Dec 04 04:00:00 EST 2013 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4848298· OSTI ID:22261950

Rangel-Kuoppa, Victor-Tapio ^[1]

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1. Institute of Semiconductor and Solid State Physics, Johannes Kepler Universität, A-4040 Linz (Austria)

The conduction band offset between strained CdSe layers embedded in unintentionally n-type doped ZnSe is measured and reported. Two samples, consisting of thirty Ultra Thin Quantum Wells (UTQWs) of CdSe embedded in ZnSe, grown by Atomic Layer Epitaxy, are used for this study. The thicknesses of the UTQWs are one and three monolayers (MLs) in each sample, respectively. As expected, the sample with one ML UTQWs does not show any energy level in the UTQWs due to the small thickness of the UTQWs, while the thickness of the sample with 3 ML UTQWs is large enough to form an energy level inside the UTQWs. This energy level appears as a majority trap with an activation energy of 223.58 ± 9.54 meV. This corresponds to UTQWs with barrier heights (the conduction band offset) between 742 meV and 784 meV. These values suggest that the band gap misfit between strained CdSe and ZnSe is around 70.5 to 74 % in the conduction band.

• OSTI ID: 22261950
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1566; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ACTIVATION ENERGY
CADMIUM SELENIDES
DOPED MATERIALS
ENERGY LEVELS
EPITAXY
LAYERS
MEV RANGE
QUANTUM WELLS
STRAINS
THICKNESS
ZINC SELENIDES