Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube

Journal Article · Tue Apr 15 00:00:00 EDT 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4869340· OSTI ID:22254964

Błachucki, W.; Dousse, J. -Cl.; Hoszowska, J. ^[1]; Neff, M.; Romano, V. ^[2]

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1. Department of Physics, University of Fribourg, 1700 Fribourg (Switzerland)
2. Institute of Applied Physics, University of Bern, 3012 Bern (Switzerland)

The high-resolution von Hamos bent crystal spectrometer of the University of Fribourg was upgraded with a focused X-ray beam source with the aim of performing micro-sized X-ray fluorescence (XRF) measurements in the laboratory. The focused X-ray beam source integrates a collimating optics mounted on a low-power micro-spot X-ray tube and a focusing polycapillary half-lens placed in front of the sample. The performances of the setup were probed in terms of spatial and energy resolution. In particular, the fluorescence intensity and energy resolution of the von Hamos spectrometer equipped with the novel micro-focused X-ray source and a standard high-power water-cooled X-ray tube were compared. The XRF analysis capability of the new setup was assessed by measuring the dopant distribution within the core of Er-doped SiO{sub 2} optical fibers.

• OSTI ID: 22254964
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 4 Vol. 85; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BEAMS
CRYSTALS
DOPED MATERIALS
ENERGY RESOLUTION
FLUORESCENCE
FOCUSING
LENSES
OPTICAL FIBERS
OPTICS
SILICA
SILICON OXIDES
SPECTROMETERS
WATER COOLED REACTORS
X RADIATION
X-RAY FLUORESCENCE ANALYSIS
X-RAY SOURCES
X-RAY TUBES