High-energy x-ray diffractometer for nondestructive strain depth profile measurement

Journal Article · Sun Dec 15 00:00:00 EST 2013 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4841895· OSTI ID:22220223

Al-Shorman, M. Y. ^[1]; Jensen, T. C.; Gray, J. N. ^[2]

---

1. Department of Physics, Yarmouk University, 21163 Irbid (Jordan)
2. Center for Nondestructive Evaluation, Iowa State University, Ames, Iowa 50011 (United States)

We describe a lab-based high-energy x-ray diffraction system and a new approach to nondestructively measuring strain profiles in polycrystalline samples. This technique utilizes the tungsten K{sub α1} characteristic radiation from a standard industrial x-ray tube. We introduce a simulation model that is used to determine strain values from data collected with this system. Examples of depth profiling are shown for shot peened aluminum and titanium samples. Profiles to 1 mm depth in aluminum and 300 μm depth in titanium with a depth resolution of 20 μm are presented.

• OSTI ID: 22220223
• Journal Information: Review of Scientific Instruments, Vol. 84, Issue 12; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALUMINIUM
DEPTH
NONDESTRUCTIVE TESTING
POLYCRYSTALS
RESOLUTION
STRAINS
TITANIUM
TUNGSTEN
X-RAY DIFFRACTION
X-RAY DIFFRACTOMETERS
X-RAY TUBES