Pump-probe imaging of laser-induced periodic surface structures after ultrafast irradiation of Si

Journal Article · Mon Sep 30 04:00:00 EDT 2013 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4823588· OSTI ID:22217937

Murphy, Ryan D. ^[1]; Torralva, Ben ^[2]; Adams, David P. ^[3]; Yalisove, Steven M. ^[4]

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1. Applied Physics Program, University of Michigan, Ann Arbor, Michigan 48109 (United States)
2. Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, Ann Arbor, Michigan 48109 (United States)
3. Sandia National Laboratories, Albuquerque, New Mexico 87123 (United States)
4. Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109 (United States)

Ultrafast pump-probe microscopy has been used to investigate laser-induced periodic surface structure (LIPSS) formation on polished Si surfaces. A crater forms on the surface after irradiation by a 150 fs laser pulse, and a second, subsequent pulse forms LIPSS within the crater. Sequentially delayed images show that LIPSS with a periodicity slightly less than the fundamental laser wavelength of 780 nm appear on Si surfaces ∼50 ps after arrival of the second pump laser pulse, well after the onset of melting. LIPSS are observed on the same timescale as material removal, suggesting that their formation involves material ejection.

• OSTI ID: 22217937
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 14 Vol. 103; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BEAMS
IMAGES
IRRADIATION
LASERS
MELTING
OPTICAL MICROSCOPY
OPTICAL PUMPING
PERIODICITY
PROBES
PULSES
PUMPS
SEMICONDUCTOR MATERIALS
SILICON
SURFACES
WAVELENGTHS