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Effect of annealing temperature on the supercapacitor behaviour of β-V{sub 2}O{sub 5} thin films

Journal Article · · Materials Research Bulletin
 [1]; ;  [2]
  1. Department of Physics, PSNA College of Engineering and Technology, Dindigul 624622 (India)
  2. Department of Physics, Gandhigram Rural Institute, Deemed University, Gandhigram 624302 (India)
Graphical abstract: Display Omitted Highlights: ► Structural, optical, supercapacitor properties of β-V{sub 2}O{sub 5} thin films are reported. ► Influence of annealing temperature on β-V{sub 2}O{sub 5} thin films have been studied. ► Film annealed at 300 °C exhibit lower charge transfer resistance. -- Abstract: Vanadium pentoxide thin films are prepared via sol–gel spin coating method. The films coated on FTO and glass substrates are treated at different temperatures ranging from 250 °C to 400 °C. The structural, optical and electrochemical investigations are made. X-ray diffraction analysis shows the film to be composed of V{sub 2}O{sub 5} in β-phase up to annealing temperature of 350 °C and at 400 °C the structural transformation to α-phase is observed. FTIR spectrum shows the formation of V-O bond. The SEM images reveal the formation of nanopores. Optical absorption studies indicate a band gap of 2.2–2.4 eV. The supercapacitor behaviour is studied using cyclic voltammetery technique and electrochemical impedance analysis. The vanadium pentoxide films annealed at 300 °C for an hour exhibits a maximum specific capacitance of 346 F g{sup −1} at a scan rate of 5 mV s{sup −1}.
OSTI ID:
22215851
Journal Information:
Materials Research Bulletin, Journal Name: Materials Research Bulletin Journal Issue: 2 Vol. 48; ISSN MRBUAC; ISSN 0025-5408
Country of Publication:
United States
Language:
English

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