Determination of thermal and electronic carrier transport properties of SnS thinfilms using photothermal beam deflection technique

Journal Article · Thu Nov 15 04:00:00 EST 2012 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2012.06.025· OSTI ID:22215619

Sajeesh, T. H.; Kartha, C. Sudha; Vijayakumar, K. P. ^[1]

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1. Cochin University of Science and Technology, Cochin 682 022 (India)

Graphical abstract: Display Omitted Highlights: ► Determination of carrier transport properties of SnS thin films non-destructively. ► SnS thin films were deposited by chemical spray pyrolysis technique. ► Photothermal beam deflection technique is used for film analysis. ► Optimization of film deposition parameters. ► Photothermal imaging of SnS films. -- Abstract: Photothermal beam deflection technique is an efficient tool for non-destructive evaluation of thin films. Thin films of tin mono sulphide, which find application as absorber layer in photovoltaic cells, were deposited by chemical spray pyrolysis technique and their carrier transport properties were determined using photothermal beam deflection technique. Thermal diffusivity, minority carrier lifetime, mobility and surface recombination velocity of these films fabricated under different spray conditions like varying spray rate, Sn/S ratio and substrate temperature were determined. Photothermal beam deflection technique was also employed for constructing the thermal images of these films to evaluate the film uniformity.

• OSTI ID: 22215619
• Journal Information: Materials Research Bulletin, Journal Name: Materials Research Bulletin Journal Issue: 11 Vol. 47; ISSN MRBUAC; ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CARRIER LIFETIME
DEPOSITION
DEPOSITS
EVALUATION
PHOTOVOLTAIC CELLS
PYROLYSIS
SUBSTRATES
SURFACES
THERMAL DIFFUSIVITY
THIN FILMS
TIN SULFIDES