Photothermal deflection spectroscopy and detection

Journal Article · Wed Apr 15 04:00:00 EST 1981 · Applied Optics

DOI:https://doi.org/10.1364/AO.20.001333· OSTI ID:1077131

Jackson, W. B. ^[1]; Amer, Nabil M. ^[1]; Boccara, A. C. ^[2]; Fournier, D. ^[2]

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1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Applied Physics & Laser Spectroscopy Group; Univ. of California, Berkeley, CA (United States)
2. Ecole Superieure de Physique et de Chimie Industrielles (ESPCI), ParisTech (France). Lab. d'Optique Physique

The theory for a sensitive spectroscopy based on the photothermal deflection of a laser beam is developed. We consider cw and pulsed cases of both transverse and collinear photothermal deflection spectroscopy for solids, liquids, gases, and thin films. The predictions of the theory are experimentally verified, its implications for imaging and microscopy are given, and the sources of noise are analyzed. The sensitivity and versatility of photothermal deflection spectroscopy are compared with thermal lensing and photoacoustic spectroscopy.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC02-05CH11231; W-7405-ENG-48
• OSTI ID: 1077131
• Report Number(s): LBL--11541
• Journal Information: Applied Optics, Journal Name: Applied Optics Journal Issue: 8 Vol. 20; ISSN 0003-6935; ISSN APOPAI
• Publisher: Optical Society of America (OSA)
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS