Structural, spectroscopic and dielectric investigations on Ba{sub 8}Zn(Nb{sub 6-x}Sb{sub x})O{sub 24} microwave ceramics

Journal Article · Fri Oct 15 04:00:00 EDT 2010 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2010.06.053· OSTI ID:22202824

Suresh, M. K.; John, Annamma; Thomas, J. K.; Wariar, P. R.S. ^[1]; Solomon, Sam ^[1]

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1. Department of Physics, Mar Ivanios College, Thiruvananthapuram 695015, Kerala (India)

Ba{sub 8}Zn(Nb{sub 6-x}Sb{sub x})O{sub 24} (x = 0, 0.3, 0.6, 0.9, 1.2, 1.5, 1.8 and 2.4) ceramics were prepared through the conventional solid-state route. The materials were calcined at 1250 {sup o}C and sintered in the range 1400-1425 {sup o}C. The structure of the system was analyzed by X-ray diffraction, Fourier transform infrared and Raman spectroscopic methods. The theoretical and experimental densities were calculated. The microstructure of the sintered pellets was analyzed using scanning electron microscopy. The low frequency dielectric properties were studied in the frequency range 50 Hz-2 MHz. The dielectric constant ({epsilon}{sub r}), temperature coefficient of resonant frequency ({tau}{sub f}) and the unloaded quality factor (Q{sub u}) are measured in the microwave frequency region using cavity resonator method. The {tau}{sub f} values of the samples reduced considerably with the increase in Sb concentration. The materials have intense emission lines in the visible region. The compositions have good microwave dielectric properties and photoluminescence and hence are suitable for dielectric resonator and ceramic laser applications.

• OSTI ID: 22202824
• Journal Information: Materials Research Bulletin, Journal Name: Materials Research Bulletin Journal Issue: 10 Vol. 45; ISSN MRBUAC; ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CAVITY RESONATORS
CERAMICS
DENSITY
DIELECTRIC MATERIALS
FOURIER TRANSFORMATION
LASERS
MICROSTRUCTURE
PERMITTIVITY
PHOTOLUMINESCENCE
QUALITY FACTOR
RAMAN SPECTROSCOPY
SCANNING ELECTRON MICROSCOPY
TEMPERATURE COEFFICIENT
X-RAY DIFFRACTION