Enhanced thermoelectric performance in spark plasma textured bulk n-type BiTe{sub 2.7}Se{sub 0.3} and p-type Bi{sub 0.5}Sb{sub 1.5}Te{sub 3}
- Laboratoire CRISMAT, CNRS UMR 65086, ENSICAEN, 6 Bld., Marechal Juin, 14050 Caen (France)
Bulk p and n-type bismuth tellurides were prepared using spark plasma texturization method. The texture development along the uniaxial load in the 001 direction is confirmed from both x-ray diffraction analysis and electron backscattering diffraction measurements. Interestingly, those textured samples outperform the samples prepared by conventional spark plasma sintering (SPS) leading to a reduced thermal conductivity in the ab-plane. The textured samples of n-type BiTe{sub 2.7}Se{sub 0.3} and p-type Bi{sub 0.5}Sb{sub 1.5}Te{sub 3} showed a 42% and 33% enhancement in figure of merit at room temperature, respectively, as compared to their SPS counterparts, opening the route for applications.
- OSTI ID:
- 22162955
- Journal Information:
- Applied Physics Letters, Vol. 102, Issue 21; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANTIMONY COMPOUNDS
BACKSCATTERING
BISMUTH COMPOUNDS
BISMUTH TELLURIDES
COMPARATIVE EVALUATIONS
ELECTRIC CONDUCTIVITY
ELECTRIC SPARKS
ELECTRON DIFFRACTION
N-TYPE CONDUCTORS
PLASMA
P-TYPE CONDUCTORS
SELENIUM COMPOUNDS
SEMICONDUCTOR MATERIALS
TELLURIUM COMPOUNDS
TEMPERATURE RANGE 0273-0400 K
TERNARY ALLOY SYSTEMS
THERMAL CONDUCTIVITY
THERMOELECTRICITY
X-RAY DIFFRACTION
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANTIMONY COMPOUNDS
BACKSCATTERING
BISMUTH COMPOUNDS
BISMUTH TELLURIDES
COMPARATIVE EVALUATIONS
ELECTRIC CONDUCTIVITY
ELECTRIC SPARKS
ELECTRON DIFFRACTION
N-TYPE CONDUCTORS
PLASMA
P-TYPE CONDUCTORS
SELENIUM COMPOUNDS
SEMICONDUCTOR MATERIALS
TELLURIUM COMPOUNDS
TEMPERATURE RANGE 0273-0400 K
TERNARY ALLOY SYSTEMS
THERMAL CONDUCTIVITY
THERMOELECTRICITY
X-RAY DIFFRACTION