Integrated x-ray reflectivity measurements of elliptically curved pentaerythritol crystals
- National Security Technologies, LLC, Livermore, California 94551 (United States)
- Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623 (United States)
- Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
The elliptically curved pentaerythritol (PET) crystals used in the Supersnout 2 x-ray spectrometer on the National Ignition Facility at Lawrence Livermore National Laboratory have been calibrated photometrically in the range of 5.5-16 keV. The elliptical geometry provides broad spectral coverage and minimizes the degradation of spectral resolution due to the finite source size. The reflectivity curve of the crystals was measured using a x-ray line source. The integrated reflectivity (R{sub I}) and width of its curve ({Delta}{Theta}) were the measurements of major interest. The former gives the spectrometer throughput, and the latter gives the spectrometer resolving power. Both parameters are found to vary considerably with the radius of curvature of the crystal and with spectral energy. The results are attributed to an enhanced mosaic effect due to the increase in curvature. There are also contributions from the crystal cleaving and gluing processes.
- OSTI ID:
- 22093902
- Journal Information:
- Review of Scientific Instruments, Vol. 83, Issue 10; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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