skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: A technique for measuring the quality of an elliptically bent pentaerythritol [PET(002)] crystal

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4961277· OSTI ID:1390019

Here, we present a technique for determining the X-ray spectral quality from each region of an elliptically curved PET(002) crystal. The investigative technique utilizes the shape of the crystal rocking curve which changes significantly as the radius of curvature changes. This unique quality information enables the spectroscopist to verify where in the spectral range that the spectrometer performance is satisfactory and where there are regions that would show spectral distortion. A collection of rocking curve measurements for elliptically curved PET(002) has been built up in our X-ray laboratory. The multi-lamellar model from the XOP software has been used as a guide and corrections were applied to the model based upon measurements. But, the measurement of RI at small radius of curvature shows an anomalous behavior; the multi-lamellar model fails to show this behavior. The effect of this anomalous RI behavior on an X-ray spectrometer calibration is calculated. It is compared to the multi-lamellar model calculation which is completely inadequate for predicting RI for this range of curvature and spectral energies.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1390019
Report Number(s):
LLNL-CONF-737663; RSINAK
Journal Information:
Review of Scientific Instruments, Vol. 87, Issue 11; Conference: Presented at: 21st Topical Conference on High-Temperature Plasma Diagnostics, Madison, WI (United States), 5-9 Jun 2016; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 1 work
Citation information provided by
Web of Science

References (6)

Integrated x-ray reflectivity measurements of elliptically curved pentaerythritol crystals journal October 2012
Measuring the diffraction properties of an imaging quartz(211) crystal journal June 2016
X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92 journal July 1993
Pulsed plasma source spectrometry in the 80–8000‐eV x‐ray region journal October 1983
Determining the diffraction properties of a cylindrically bent KAP(001) crystal from 1 to 5 keV conference August 2015
Computer simulation of bent perfect crystal diffraction profiles conference December 1997

Cited By (1)

Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals journal February 2017

Similar Records

A technique for measuring the quality of an elliptically bent pentaerythritol [PET(002)] crystal
Journal Article · Tue Nov 15 00:00:00 EST 2016 · Review of Scientific Instruments · OSTI ID:1390019

A technique for measuring the quality of an elliptically bent PET(002) crystal
Conference · Tue Jun 07 00:00:00 EDT 2016 · Review of Scientific Instruments · OSTI ID:1390019

Integrated X-ray Reflectivity Measurements for Elliptically Curved PET Crystals
Conference · Mon Oct 01 00:00:00 EDT 2012 · Review of Scientific Instruments · OSTI ID:1390019