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Title: Epitaxial relationship of semipolar s-plane (1101) InN grown on r-plane sapphire

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4731788· OSTI ID:22092041
 [1]
  1. Department of Physics, Aristotle University of Thessaloniki, GR 541 26 Thessaloniki (Greece)

The heteroepitaxy of semipolar s-plane (1101) InN grown directly on r-plane sapphire by plasma-assisted molecular beam epitaxy is studied using transmission electron microscopy techniques. The epitaxial relationship is determined to be (1101){sub InN} Parallel-To (1102){sub Al{sub 2O{sub 3}}}, [1120]{sub InN} Parallel-To [2021]{sub Al{sub 2O{sub 3}}}, [1102]{sub InN}{approx} Parallel-To [0221]{sub Al{sub 2O{sub 3}}}, which ensures a 0.7% misfit along [1120]{sub InN}. Two orientation variants are identified. Proposed geometrical factors contributing to the high density of basal stacking faults, partial dislocations, and sphalerite cubic pockets include the misfit accommodation and reduction, as well as the accommodation of lattice twist.

OSTI ID:
22092041
Journal Information:
Applied Physics Letters, Vol. 101, Issue 1; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English