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A p-type Heusler compound: Growth, structure, and properties of epitaxial thin NiYBi films on MgO(100)

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4764520· OSTI ID:22089516
 [1]; ; ; ;  [2]; ; ;  [3];  [1];  [4]
  1. Institut fuer Anorganische und Analytische Chemie, Johannes Gutenberg - Universitaet, 55099 Mainz (Germany)
  2. Max Planck Institute for Chemical Physics of Solids, 01187 Dresden (Germany)
  3. IBM Almaden Research Center, San Jose, California 95120 (United States)
  4. Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Hyogo 679-5198 (Japan)
Epitaxial semiconducting NiYBi thin films were directly prepared on MgO(100) substrates by magnetron sputtering. The intensity ratio of the (200) and (400) diffraction peaks, I(200)/I(400) = 2.93, was close to the theoretical value (3.03). The electronic structure of NiYBi was calculated using wien2k, and a narrow indirect band gap of width of 210 meV was found. The valence band spectra of the films obtained by linear dichroism in hard x-ray photoelectron spectroscopy exhibit clear structures that are in good agreement with the calculated band structure of NiYBi.
OSTI ID:
22089516
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 21 Vol. 101; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English

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