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Title: High-speed X-ray phase tomography with Talbot interferometer and fringe scanning method

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4742302· OSTI ID:22069171
; ; ;  [1]
  1. Department of Applied Physics, Faculty of Engineering, University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561 (Japan)

High-speed X-ray phase tomography based on the Fourier-transform method has been demonstrated with an X-ray Talbot interferometer using white synchrotron radiation. We report the experimental results of high-speed X-ray phase tomography with fringe-scanning method instead of Fourier-transform method to improve spatial resolution without a considerable increase of scan time. To apply fringe-scanning method to high speed tomography, we tested a scan that is a synchronous combination of one-way continuous movements of the sample rotation and the grating displacement. When this scanning method was combined with X-ray phase tomography, we were able to obtain a scan time of 5 s. A comparison of the image quality derived with the conventional approach and with the proposed approach using the fringe-scanning method showed that the latter had better spatial resolution.

OSTI ID:
22069171
Journal Information:
AIP Conference Proceedings, Vol. 1466, Issue 1; Conference: International workshop on X-ray and neutron phase imaging with gratings, Tokyo (Japan), 5-7 Mar 2012; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English