Development of Apparatus for Phase Imaging Using X-Ray Interferometers at BL20XU of SPring-8
- Department of Advanced Materials Science, Graduate School of Frontier Sciences, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)
- Department of Applied Physics, School of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan)
- SPring-8, 1-1-1 Kouto, Mikazuki, Hyogo 679-5198 (Japan)
Phase-contrast X-ray imaging, including phase tomography, was performed at the medium-length beamline BL20XU of SPring-8, where undulator X rays were available at 245 m from the source point. A crystal X-ray interferometer and an X-ray Talbot interferometer with transmission gratings were used to perform different kinds of phase-contrast imaging. The crystal X-ray interferometer was devised in that a crystal lamella for beam recombination was thinned down to 40 {mu}m to achieve high-resolution imaging. A quick fringe-scanning mechanism was also constructed enabling the phase measurement with a few second and therefore phase tomography with several minutes. The X-ray Talbot interferometer was studied as a novel and simple method that generated a contrast corresponding to differential phase. Phase tomography was also attained with the X-ray Talbot interferometer.
- OSTI ID:
- 20652855
- Journal Information:
- AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1758029; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
Similar Records
X-ray Talbot-Lau interferometer for high-speed phase imaging and tomography using white synchrotron radiation
A general theory of interference fringes in x-ray phase grating imaging