Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Streaking and Wigner time delays in photoemission from atoms and surfaces

Journal Article · · Physical Review. A
;  [1]
  1. Department of Physics, Kansas State University, Manhattan, Kansas 66506 (United States)

Streaked photoemission metrology allows the observation of an apparent relative time delay between the detection of photoelectrons from different initial electronic states. This relative delay is obtained by recording the photoelectron yield as a function of the delay between an ionizing ultrashort extended ultraviolet pulse and a streaking infrared (IR) pulse. Theoretically, photoemission delays can be defined based on (i) the phase shift the photoelectron wave function accumulates during the release and propagation of the photoelectron (''Wigner delay'') and, alternatively, (ii) the streaking trace in the calculated photoemission spectrum (''streaking delay''). We investigate the relation between Wigner and streaking delays in the photoemission from atomic and solid-surface targets. For solid targets and assuming a vanishing IR skin depth, both Wigner and streaking delays can be interpreted as an average propagation time needed by photoelectrons to reach the surface, while the two delays differ for nonvanishing skin depths. For atomic targets, the difference between Wigner and streaking delays depends on the range of the ionic potential.

OSTI ID:
22068720
Journal Information:
Physical Review. A, Journal Name: Physical Review. A Journal Issue: 3 Vol. 84; ISSN 1050-2947; ISSN PLRAAN
Country of Publication:
United States
Language:
English

Similar Records

Photoelectron–residual-ion interaction in angle-resolved streaked shake-up ionization of helium
Journal Article · Mon Jan 27 23:00:00 EST 2025 · Physical Review A · OSTI ID:3003086

Delay in Atomic Photoionization
Journal Article · Thu Dec 02 23:00:00 EST 2010 · Physical Review Letters · OSTI ID:21554441

Spatiotemporal analysis of a final-state shape resonance in interferometric photoemission from Cu(111) surfaces
Journal Article · Mon Oct 21 00:00:00 EDT 2019 · Physical Review A · OSTI ID:1800606