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Title: Single-shot electron bunch length measurements using a spatial electro-optical autocorrelation interferometer

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.3480997· OSTI ID:22058635
 [1];  [2];  [3];  [4];  [5];  [6]
  1. PUBLICA Swiss Federal Pension Fund, CH-3000 Berne (Switzerland)
  2. General and Theoretical Electrical Engineering (ATE), Faculty of Engineering, University of Duisburg-Essen, D-47048 Duisburg (Germany)
  3. Department of Large Research Facilities, Paul Scherrer Institute, CH- 5232 Villigen (Switzerland)
  4. Laboratory for Micro- and Nanotechnology, Paul Scherrer Institute, CH- 5232 Villigen (Switzerland)
  5. Department of Information Technology and Electrical Engineering, Electronics Laboratory, ETHZ, CH-8092 Zurich (Switzerland)
  6. Department of Microwave Physics, Institute of Applied Physics, University of Berne, CH-3012 Berne (Switzerland)

A spatial, electro-optical autocorrelation (EOA) interferometer using the vertically polarized lobes of coherent transition radiation (CTR) has been developed as a single-shot electron bunch length monitor at an optical beam port downstream the 100 MeV preinjector LINAC of the Swiss Light Source. This EOA monitor combines the advantages of step-scan interferometers (high temporal resolution) [D. Mihalcea et al., Phys. Rev. ST Accel. Beams 9, 082801 (2006) and T. Takahashi and K. Takami, Infrared Phys. Technol. 51, 363 (2008)] and terahertz-gating technologies [U. Schmidhammer et al., Appl. Phys. B: Lasers Opt. 94, 95 (2009) and B. Steffen et al., Phys. Rev. ST Accel. Beams 12, 032802 (2009)] (fast response), providing the possibility to tune the accelerator with an online bunch length diagnostics. While a proof of principle of the spatial interferometer was achieved by step-scan measurements with far-infrared detectors, the single-shot capability of the monitor has been demonstrated by electro-optical correlation of the spatial CTR interference pattern with fairly long (500 ps) neodymium-doped yttrium aluminum garnet (Nd:YAG) laser pulses in a ZnTe crystal. In single-shot operation, variations of the bunch length between 1.5 and 4 ps due to different phase settings of the LINAC bunching cavities have been measured with subpicosecond time resolution.

OSTI ID:
22058635
Journal Information:
Review of Scientific Instruments, Vol. 81, Issue 10; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English