Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response

Journal Article · Fri Oct 15 00:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3488628· OSTI ID:22055742

Geandier, G ^[1]; Thiaudiere, D; Bouaffad, A ^[2]; Randriamazaoro, R N; Chiron, R; Castelnau, O; Faurie, D ^[3]; Djaziri, S; Lamongie, B; Diot, Y; Le Bourhis, E; Renault, P O; Goudeau, P ^[1]; Hild, F ^[4]

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1. Departement PMM, Institut Pprime, UPR 3346 CNRS, Universite de Poitiers-ENSMA, SP2MI, Teleport 2, Boulevard Marie et Pierre Curie, BP 30179-86962 Futuroscope Chasseneuil Cedex (France)
2. Synchrotron SOLEIL, L'Orme des Merisiers, BP 48, 91192 Gif sur Yvette (France)
3. LPMTM, UPR 9001 CNRS, Universite Paris-Nord, 93430 Villetaneuse (France)
4. LMT Cachan, 61 Avenue du President Wilson, 94235 Cachan Cedex (France)

We have developed on the DIFFABS-SOLEIL beamline a biaxial tensile machine working in the synchrotron environment for in situ diffraction characterization of thin polycrystalline films mechanical response. The machine has been designed to test compliant substrates coated by the studied films under controlled, applied strain field. Technological challenges comprise the sample design including fixation of the substrate ends, the related generation of a uniform strain field in the studied (central) volume, and the operations from the beamline pilot. Preliminary tests on 150 nm thick W films deposited onto polyimide cruciform substrates are presented. The obtained results for applied strains using x-ray diffraction and digital image correlation methods clearly show the full potentialities of this new setup.

• OSTI ID: 22055742
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 81; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
43 PARTICLE ACCELERATORS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DESIGN
IMAGES
MECHANICAL PROPERTIES
POLYCRYSTALS
STRAINS
SYNCHROTRONS
THIN FILMS
X-RAY DIFFRACTION