Investigation of the formation of quasicrystalline Al{sub 70}-Pd{sub 20}-Re{sub 10} phase in situ during annealing
Journal Article
·
· Crystallography Reports
- Russian Research Center Kurchatov Institute (Russian Federation)
- Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)
The change in the phase composition of thin-film layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al{sub 3}Pd phase is formed at a temperature above 260 Degree-Sign C, which transforms into the AlPd phase at 580 Degree-Sign C, and the icosahedral quasicrystalline Al-Pd-Re phase is formed at 680 Degree-Sign C.
- OSTI ID:
- 22054258
- Journal Information:
- Crystallography Reports, Journal Name: Crystallography Reports Journal Issue: 5 Vol. 56; ISSN 1063-7745; ISSN CYSTE3
- Country of Publication:
- United States
- Language:
- English
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