Determining time resolution of microchannel plate detectors for electron time-of-flight spectrometers

Journal Article · Thu Jul 15 04:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3463690· OSTI ID:22053777

Qi, Zhang; Kun, Zhao ^[1]; Zenghu, Chang ^[1]

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1. J.R. Macdonald Laboratory, Department of Physics, Kansas State University, Manhattan, Kansas 66506 (United States)

The temporal resolution of a 40 mm diameter chevron microchannel plate (MCP) detector followed by a constant fraction discriminator and a time-to-digital converter was determined by using the third order harmonic of 25 fs Ti:sapphire laser pulses. The resolution was found to deteriorate from 200 to 300 ps as the total voltage applied on the two MCPs increased from 1600 to 2000 V. This was likely due to a partial saturation of the MCP and/or the constant fraction discriminator working with signals beyond its optimum range of pulse width and shape.

• OSTI ID: 22053777
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 7 Vol. 81; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ELECTRON SPECTROMETERS
LASER RADIATION
MICROCHANNEL ELECTRON MULTIPLIERS
PULSES
SAPPHIRE
SIGNALS
TIME RESOLUTION
TIME-OF-FLIGHT SPECTROMETERS
TITANIUM