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Phase transitions in thin Ge{sub 2}Sb{sub 2}Te{sub 5} chalcogenide films according to Raman spectroscopy data

Journal Article · · Semiconductors
; ;  [1];  [2];  [3]
  1. Ryazan State Radio Engineering University (Russian Federation)
  2. Russian Academy of Sciences, Kurnakov Institute of General and Inorganic Chemistry (Russian Federation)
  3. Russian Academy of Sciences, Ioffe Physical-Technical Institute (Russian Federation)
Data on the Raman spectra of thin Ge{sub 2}Sb{sub 2}Te{sub 5} chalcogenide semiconductor films are reported. The study is performed with the purpose of determining the temperatures of phase transitions initiated by laser radiation.
OSTI ID:
22038989
Journal Information:
Semiconductors, Journal Name: Semiconductors Journal Issue: 5 Vol. 46; ISSN SMICES; ISSN 1063-7826
Country of Publication:
United States
Language:
English